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Simple and analytical function for the Stark profile of the Hα line and its application to plasma characterization
The increasing application of plasma based technologies over a wide range of fields has led to the necessity of an optimal determination of the characteristic parameters of the plasma systems. Optical Emission Spectroscopy ...
A simple and accurate analytical model of the Stark profile and its application to plasma characterization
Optical Emission Spectroscopy techniques are among the most employed to perform the characterization of laboratory plasmas. The analysis of the obtained data is based on the convolution of three different types of profiles: ...
Stark Broadening of Se IV, Sn IV, Sb IV and Te IV Spectral Lines
Stark broadening parameters, line width and shift, are needed for investigations, análisis and modelling of astrophysical, laboratory, laser produced and technological plasmas. Especially in astrophysics, due to constantly ...