Browsing Producción Científica by Subject "B. Electron microscopy"
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Dislocation microstructure of 4H–SiC single crystals plastically deformed around the transition temperature
(The American Ceramic Society, 2012)4H–SiC specimens were plastically deformed by basal slip at temperatures between 800 °C and 1300 °C. Samples were investigated by means of transmission electron microscopy and high-resolution techniques. The accepted ...